SAIC

Low-temperature test chambers are dedicated to evaluating the storage reliability and environmental adaptability of electronic and electrical products, automotive components, household appliances, and related materials in extreme cold climates.

When troubleshooting issues with a high and low temperature alternating humidity test chamber, it is essential to first identify the root cause of the problem.

Previously, we introduced some common problems with high and low temperature test chambers. Today, we will discuss the issue of slow cooling in the test equipment, which may be caused by malfunctions in the refrigeration system.

During the past twelve months, several third-party testing bodies and OEM laboratories reported the same problem: when running dust tests in accordance with GB/T 4208, IEC 60529 or MIL-STD-810, the batch cycle has stretched from 48 h to 72 h, even 96 h, while energy consumption has risen by more than 30 %.

For high and low temperature humidity test chambers, daily troubleshooting of abnormalities is essential.