SAIC

Following our previous discussion on the effects of high-temperature environmental testing, this paper systematically summarizes the typical property changes that occur in test specimens within low-temperature test chambers (hereinafter referred to as “the equipment”).

The primary function of a high and low-temperature alternating test chamber is to assess the adaptability of product materials under various climatic conditions.

Although both thermal-shock and steady-state temperature/humidity tests fall under the umbrella of “weathering verification”, they differ fundamentally in physical modelling, control logic and safety strategy.

Temperature is the most fundamental—and most brutal—physical parameter influencing the reliability of materials, components and complete systems. GB/T 2423.1, GB/T 2423.2, GJB 150.3A, GJB 150.4A, DO-160 Section 4/5, IEC 60068-2-1/-2 and MIL-STD-810H all quantify requirements for temperature slew rate, dwell time, heat load and measurement uncertainty.

A xenon lamp aging test chamber is used to simulate natural environmental conditions such as sunlight, rain, and biodegradation, which continuously degrade products. To ensure product durability, this equipment artificially replicates these conditions to test whether the product meets quality standards.