SAIC

A low-temperature test chamber is a device used to test the cold resistance of electronic components or special materials.

Cold and hot shock test chambers utilize high-temperature and low-temperature zones during testing.

Recently, our company's technical department, through close communication and coordination with the scientific research team of Xi'an Jiaotong University, has gained a deep understanding of their environmental testing needs and challenges.

One point of plowing, one point of harvest. At the beginning of the new year, the branches and subsidiaries of LFG have delivered brilliant report cards with successive good news. A white horse passes by, the years go by like a shuttle, what changes is the cycle of time and space, what remains unchanged is the seriousness and persistence of LF people.

Temperature is the most fundamental—and most brutal—physical parameter influencing the reliability of materials, components and complete systems. GB/T 2423.1, GB/T 2423.2, GJB 150.3A, GJB 150.4A, DO-160 Section 4/5, IEC 60068-2-1/-2 and MIL-STD-810H all quantify requirements for temperature slew rate, dwell time, heat load and measurement uncertainty.