I wonder if anyone has encountered the phenomenon where the equipment trips or trips the circuit breaker as soon as it is started during the use of a high-low temperature and humidity test chamber. Why does this happen?
High and low temperature alternating test chambers actually come in various structural designs. No device is perfect, but each has its own set of advantages and disadvantages. Today, I will review the pros and cons of four different structural designs of these test chambers.
During the past twelve months, several third-party testing bodies and OEM laboratories reported the same problem: when running dust tests in accordance with GB/T 4208, IEC 60529 or MIL-STD-810, the batch cycle has stretched from 48 h to 72 h, even 96 h, while energy consumption has risen by more than 30 %.
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