Temperature shock test chamber used to test the material structure or composite material, under the instantaneous high temperature, low temperature continuous environment can tolerate the degree for scientific research, schools, factories, military and other units for electrical, electronic products, semiconductors, Electronic circuit boards, metal materials, bearings and other materials in a rapidly changing environment temperature adaptability test.
1. Test objectives: Determine the adaptability and destructiveness of the test product in the event of a drastic change in ambient air temperature.
2. Test condition:Temperature in High Temp. Zone:50～180℃;Temperature in Low Temp. Zone:RT～-70℃,Temperature retention time: 1h or until the test sample reaches temperature stability,cycle-index: according to the standard test method or user.
3. Recovery：After the test product is taken out of the hot and cold impact box, it should be recovered under normal test atmosphere until the temperature of the test sample reaches a stable temperature
4. Thermal shock test chamber reference standard：(according to you requirements)
GJB360A-96 method107,Temperature impact test requirements
IEC 60068-2-1：2007, Environmental Testing--Part 2-1: Tests--Test A: Cold, IDT;
IEC 60068-2-2：2007, Environmental Testing--Part 2-2: Tests--Test B: Cold, IDT;
IEC 60068-2-14:1984, Basic environmental testing procedures- Part 2: Test--Test N: Change of temperature. IDT;
GJB 150.5A-2009,Environmental testing methods for military equipment laboratories - Part 5: Temperature impact test;
GJB 150.3A-2009, Laboratory environmental test methods for military materiel---Part 3: High temperature test;
5. Temperature shock test chamber control system
From High Temp. Zone to Low Temp. Zone Temperature Change Time≤15s。
Temperature recovery time:≤5min
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